Transport assembly

ABSTRACT

A reed switch analyzer for testing the mechanical and electrical characteristics of reed switches employs a unique transport assembly in a test head for advancing the reed switches through various test stations and timer means for synchronizing the operation of the test head with the reed switch manufacturing machine so that the test head is compact and is easily and conveniently added to or removed from the manufacturing machine without interfering with its operation. The test head provides test result signals for separating good switches from the bad ones and for providing feedback information to the machine operator for quality control purposes as the switches are automatically received from the manufacturing machine.

United States Patent [1 1 Squires et al.

[ TRANSPORT ASSEMBLY [75] lnventorsi Howard J. Squires, Rochester;

Donald C. Rimlinger, Holcomb, both of N.Y. [73] Assignee:'Stromberg-Carlson Corporation,

Rochester, N.Y. [22] Filed: Nov. 16,1973

[21] Appl. No.: 416,538

Related U.S. Application Data [62] Division of Ser. No. 366,938, June 4,1973.

52 us. or. 29/203 P [51] Int. Cl H01r 43/00 [58] Field of Search 29/203P, 203 R, 203 29/203 D [56] References Cited UNITED STATES PATENTS2,755,760 7/1956 Fermanian et al. 29/203 1 12/1971 Marlin et al 29/203 PPrimary Examiner-Thomas H. Eager Attorney, Agent, or Firm-William F.Porter,'Jr.

[57] ABSTRACT A reed switch analyzer for testing the mechanical andelectrical characteristics of reed switchesemploys a unique transportassembly in a test head for advancing the reed switches through varioustest stations and timer means for synchronizing the operation of thetest head with the reed switch manufacturing machine so that the testhead is compact and is easily and conveniently added to or removed fromthe manufacturing machine without interfering with its operation. Thetest head provides test result signals for separating good switches fromthe bad ones and for providing feedback information to the machineoperator for quality control purposes as the switches are automaticallyreceived from the manufacturing machine.

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a F H TRANSPORT ASSEMBLY BACKGROUND OF THE INVENTION This application isa Division of application Ser. No. 366,938, filed on June 4, 1973.

The subject invention pretains generally to the manufacture of reedswitches and specifically to a compact testing machine which may beeasily and conveniently added to the manufacturing machine for analyzingand displaying the characteristics of theswitches with regard topredetermined standards.

Reed switches are common electrical switching devices consisting of twometal paddles separated by a narrow gap in a glass encapsulated vacuumwith the leads brought out for connection in the electrical path whichis to be controlled. The switches are normally manufactured on amultihead machine with each head carrying a single switch throughvarious processing stations, each station providing a different step inthe overall manufacturing cycle. Such a machine is disclosed in a US.Pat. No. 3,626,571, entitled, Apparatus For Assembling Sealed ContactSwitches which was issued to Glenn Ardrian Marlin, etal., on Dec. 14,1971. The switch is housed in an electrical coil which is then energizedto establish a magnetic field for closin g the switch and de-energizedthereafter for removing the magnetic field to open the switch. Becausethe switch is small and simple in structure its mechanical andelectrical characteristics are particularly critical to its properoperation. Regarding its mechanical characteristics its overall length(from the end of one lead to the other) should be within a smalltolerance while the leads should be concentric with another so that theyare perfectly aligned. Regarding the electrical operat ingcharacteristics the gap should not be too narrow, lestthe switchoperates (close) or releases prematurely in the presence of a magneticfield nor should the gap be too large lest the switches not close orremain closed when required. Furthermore, the gap should not break downand become conductive when high voltage spurious signals areinadvertently applied to its leads.

It is important that the foregoing characteristics be tested for tworeasons: one to separate the defective switches (those which do not meetthe predetermined standards) from the good ones and two to providefeedback information to the machine operator about specificcharacteristics which are controllable so that he may make theappropriate adjustments on those machine heads which are shown to beproducing defective switches for quality control purposes to maximizeoutput. Because of the complexity of the test apparatus and theimportance of maintaining volume production of the reed switches whichare used in great numbers, at present the test apparatus which isavailable is physically separated from the manufacturing machine so thatit need not encumber nor in the case of failure impede manufacturingproduction. This detracts from overall efficiency however since the reedswitches must be first moved manually from the manufacturing area afterbeing unloaded from the manufacturing machine to a testing area to beloaded into the testing machine. Furthermore at present automatic testprocedures are limited to the electrical characteristics only with themechanical tests for length and, concentricity being performed by handthrough the use of gauges.

With the foregoing in mind it is a primary object of the presentinvention to provide a reed switch analyzer which is compact and so.designed that it may be easily mounted on or adjacent to a reed switchmanufacturing machine for testing the characteristics of the reedswitches as they are received from the machine and whichmay be easilyremoved thereafter without interfering with manufacturing production.

It is a further object of the present invention to provide such a reedswitch analyzer which not only monitors the electrical characteristicsof the reed switches but also the mechanical characteristics.

It is still a further object of the present invention to provide a reedswitch analyzer which not only separates the good switches from the badafter testing but which also affords immediate feedbaclk information tothe machine operator indicating which controllable characteristics thereed switches are failing to meet in accordance with the machine headson which they were produced.

These objects as well as others will be more readily apparentfrom thedetailed description of the invention hereinbelow considered in view ofthe nine attached drawings.

BRIEF DESCRIPTION OF THE INVENTION The reed switch analyzer of theinvention employs a compact test head which can easily be mounted on oradjacent to the manufacturing machine for testing the mechanical andelectrical characteristics of the reed switches as they are receivedfrom the machine. The compactness of the test head is due in great partto the transport assembly used for simultaneously moving the reedswitches through various test stations in synchronism with themanufacturing machine. The reed switches rest in pairs of supportnotches, each pair defining a station along a channel in which a carrierbar is free to move horizontally and vertically. The carrier bar hasnotches along its length which align with the support notches whenstationary. To advance the switches to the next stations the bar israised sufficiently to lift the switches out of the support notches,then moved'horizontally so that the switches are above the next supportnotches, then lowered sufficiently so that the switches are deposited inthe support notches with the carrier bar being capable of clearing theirundersides after which the bar is returned horizontally andthenvertically to its original position. This motion is repeatedcontinuously to advance the switches from station to station each timethe manufacturing machine indexes. In the preferred embodiment allmechanical movements in the test head for performing the tests as wellas for transporting the switches from station to station are provided byair cylinders controlled from solenoid valves which are responsive toelectric signals. The electric signals are generated by microswitches ina timer assembly which includes a cam shaft driven from themanufacturing machine. Since there are no direct mechanical linksbetween the test head and the manufacturing, machine, the machine neednot be stopped in order to add or remove the test head therefrom.

Electric signals are applied to and received from the test head througha connector cable so that to disengage the test head it is onlynecessary to disconnect the connector cable which does not affectmanufacturing output. The cable also carries all the digital signals toBRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is an isometric view of thecooling table which is used in conjunction with the reed switchanalyzer.

FIG. 2 is an isometric view of the test head used in the analyzer forperforming and reporting the results of the various tests; FIG. 2a showsthe underside of the restraining bar used in the test head. I

FIG. 3 is a mechanical timing chart which depicts the various signalsfor controlling mechanical movements in the test head of FIG. 2.

FIGS. 4a-4c show the transport assembly carrier bar in various positionsfor advancing the reed switches from station to station.

FIG. 5 is a schematic view of the transport assembly which is helpful inexplaining the transport motion.

FIG. 6 is a schematic diagram of the test apparatus mounted on the testhead for performing the electrical tests and generating signalindications of the results thereof.

FIG. 7 is a block diagram showing the basic components of the controlpanel and the various signal paths for controlling the tests and forprocessing and displaying the results thereof.

FIG. 8 is a schematic diagram of the test control logic in the controlpanel which controls the electrical tests as well as the processing anddisplaying of the test results.

' FIG. 9 shows the various control signals generated by the test controllogic of FIG. 8.

' FIG. 10 is a schematic diagram of the results control logic in thecontrol panel used for storing and processing the test results.

FIG. 11 is a schematic diagram of the display unit in the control panel.

DETAILED DESCRIPTION OF THE INVENTION FIG. I shows a circular coolingtable 10 which may be moved around its vertical axis in synchronism witha multihead reed switch manufacturing machine by any common drivingmechanism (not shown) linking the two. Each time the machine indexes,viz. moves its manufacturing heads from one position to the next, thecooling table 10 is partially rotated (counterclockwise as depicted inFIG. 1) so that a different one of a plurality of holes 12located'around its periphery in a rim 13 is placed underneath a loadingchute 14 to receive a singlereed switch from the machine. The coolingtable 10 permits the switches, which are still hot when received fromthe machine, to cool sufiiciently before reaching an unloading stationat point X so as to stabilize their characteristics before the tests arebegun. At point X the switches are permitted to drop by gravity througha hole (not visible) in a stationary plate 16 located below the base 17of the cooling table 10 into a test head where the tests are actuallyperformed. As a safety precaution, should a switch become jammed as itis fed into the test head. a photoelectric eye mounted thereon detectsthe condition and energizes an electromagnet 18 which preventssubsequent switches from being unloaded at point X. Each switch is thentransported to point Y where it is allowed to drop through another holein the plate 16 into a hooper placed thereunder for that purpose.

Once deposited in a hole 12, the reed switch is supported by its lowerlead standing on the plate I6, the lower lead being visible in FIG. 1because of the narrow separation 20 between the base 17 of the coolingtable 10 and the plate 16. Since the overall length of the reed switch(distance between lead ends) cannot vary greatly by the manufacturingprocess, the height of the switch relative to the plate 16 whilestanding in a hole 12 is essentially fixed. Since each hole 12 is onlylarge enough to accommodate a single free standing switch, should asecond switch inadvertently drop into an occupied hole 12, it willextend above the normally anticipated height. This is an undesirablesituation since it is important that only one switch be fed to the testhead at a time. A permanent magnet 24 is so positioned to pick off theseunwanted occupants. Should the magnet 24 fail to pick off a secondswitch in a hole 12, a feeler 26 set slightly above the normallyanticipated height is activated by the reed switch to close a circuitfor providing an audible alarm to warn the machine operator who isalways in the general vicinity. There is sufficient time between thesignalling of the alarm and the time that it takes the table 10 to movethe hole 12 having two switches therein to point X for the operator towalk over to the table 10 to remove the second switch.

Although not probable, it is possible that the manufacturing machinewill produce a reed switch having only one lead or even no leads. Theseswitches are detected at point Z to also provide an alarm to theoperator so that he may remove them to avoid feeding them into the testhead where they might otherwise create problems during testing. A feeler28 set just below the anticipated height must be activated by the upperlead of the switch together with another feeler which cannot be seen,but extends into the separation 20 at point Z to be activated by thelower lead to prevent the alarm from sounding. The lower feeler enablesthe alarm to be sounded only when a switch is in fact located in thehole 12, while the upper feeler 28 is activated only if the switch hasleads on both ends.

The test head which is represented generally by reference numeral 30 inFIG. 2 has a housing 32 on which is mounted a transport assembly formoving the reed switches from station to station and the test apparatusfor performing different tests at the various stations. Because of thetype transport assembly employed, the test head 30 is compact andtherefore easily mounted on or adjacent to the manufacturing machineitself. The mechanical movements required for transporting and testingthe reed switches are all imparted by the piston rods or plungers of aircylinders under the control of solenoid valves which are responsive toelectrical signals from a timer assembly. The timer assembly consists ofmicroswitches which are closed to apply the electrical signals to thesolenoid valves by various cams on a shaft connected to themanufacturing machine so that the mechanical movements in the test headare all synchronized to the machine movement. Preferably short pistonstrokes are controlled by a three way valve which opens the inlet portand closes the outlet port to allow air into the cylinder chamber formoving the piston when energized and closes the inlet port and opens theoutlet port to evacuate the air when de-energized to permit the pistonto return under-spring pressure. Preferably long piston strokes areprovided by a four way valve which functions with a cylinder havinginlet and outlet ports on top and bottom of the cylinder chamber. Thepiston rod is extended by energizing the valve which closes the bottominlet port and top outlet port and opens the bottom outlet port and thetop inlet port, thereby permitting air to fill the cylinder chamberabove the piston head while air is evacuated below it. To return thepiston, the valve is de-energized which closes the top inlet port andbottom outlet port and opens the bottom inlet port and top outlet portto permit air to enter the cylinder chamber below the piston head whileair is evacuated above it. Since the cylindervalve and timer assembliesare well known no further elaboration is required. For the sake ofclarity none of the ports have been shown in the drawings. The valvesare not visible in FIG. 2 because they are located physically behind thetest head 30in that view. A mechanical timing chart has been provided inFIG. 3 to relate the timing signals to the 'cam shaft rotation tofacilitate the readers understanding of the invention. Each waveformwith the exception of waveform. l0 corresponds to a different valve andits associated air cylinder, the upper level of the waveformrepresenting the period during which the valve is energized and the aircylinder is operated so that its piston rod or plunger is extended.

Looking again to FIG. 2, it is seen that the housing 32 is provided withan open channel formed in part by a rectangular groove 34 cut into thehorizontal surface thereof and a pair of parallel walls 36 disposed oneither side of the groove 34. The groove 34 is only partly visiblebecause of a carrier bar 38 which is located between the walls 36 abovethe groove 34 and which is free to move vertically (up or down)'andhorizontally (forward to the right and back) with respect to thechannel. The carrier bar 38 may be said to be in a normal level positionwhen situated as shown in FIG. 2, normal referring to the horizontalpositioning while level refers to the vertical positioning. It will benoted that in the normal level position each V notch 40 formed in thebar 38 aligns with a pair of oppositely placed V notches 42 formed inthe walls 36. It will be further noted that the horizontal distancebetween any pair of successive V notches 40 is the same. The bar 38 canbe moved forward (to the right) horizontally by an amount equal to thisdistance where in this forward position each V notch 40 can be alignedwith the pair of V notches 42 directly forward (to the right) of thepair of V notches 42 it normally aligns with when the bar 38 is thenormal level position. Each pair of V notches 42 defines a station inwhich a different reed switch resets. Different characteristictests canbe performed at different stations simultaneously while the reedswitches straddle the V notches 42 withthe bar 38in the normal levelposition.

The transport assembly for moving the reed switches from station tostation is shown in detail in FIGS. 4a,4c and schematically in FIG. 5.In FIG. 4a the housing 32 is cut away to reveal the portion of thetransport assembly located inside. This consists of a slider 44 whichcan only move horizontally to the left and back (for convenience theseviews are rotated l80 from how they would appear in FIG. 2) on fixedbearings 46 when moved by the piston rod of an air cylinder 48, a plate50 affixed to the piston rod of an air cylinder 52 which is itselfmounted to the slider 44 and a pair of air cylinders 54 mounted to theplate 50 with their piston rods each being affixed to the carrier bar38. Cylinders 52 and 54 are controlled by three-way valves whilecylinder 48 is controlled by a four-way valve.

Although in actual operation there would be a reed switch in each of thefirst six stations, for simplicity of explaining the transport motion,only one reed switch is shown in the first station which is to be movedto the second station located immediately to the left of the firststation. As shown in FIG. 4a, the carrier bar 38 is in its normal levelposition, the valves for the cylinders 48, 52 and 54 are de-energized sothat their piston rods are not extended. First, the cylinders 54 areoperated to extend their cylinder rods upward, thereby raising thecarrier bar 38 above its level (normal) position to a sufficient heightto lift the reed. switch out of the V notches 42 so that its undersidecan clear the notches. FIG. 4b shows the carrier bar in its normal upperposition. Second, cylinder 48 is operated to extend its piston rod tothe left thereby moving the carrier bar to the forward (upper) positionvia the slider 44 (it may be readily appreciated that the carrier bar 38must follow the motion of the slider 44 because of the forces pro ducedby the structural arrangement of the transport assembly). Third, the airis released from the cylinders 54 to allow the carrier bar 38'to returnto its level (forward) position thereby depositing the reed switch inthe second station and then cylinder 52 is operated to extend its pistonrod downward. This lowers the plate 50 together with the cylinders 54,.their piston rods as well as the carrier bar 38. The carrier bar 38 isthus lowered below its level (forward) position sufficiently so that thetop of the bar 38 clears the underside of the reed switch. Fourth, thepiston rod of cylinder 48 is returned to the right by putting air intothe cylinder chamber below the piston head thereby returning the carrierbar 38 to its normal (lower) position as depicted in FIG. 40. Fifth andlast, the air is evacuated from cylinder 52 permitting the carrier bar38 to be raised to its level (normal) position. This completes thetransport cycle, each reed switch having been moved to the next forwardstation. The transport cycle is represented by the first three waveformsin FIG. 3. It should be noted that the point at which the carrier bar 38is first raised (waveform l) to begin the transport cycle coincides withthe machine index point.

It should be realized that what is important here is the type of motionimparted to the carrier bar 38 for advancing each reed switch fromstation to station rather than the specific structure provided for thatpurpose, since this may easily take different forms. For instance ratherthan provide the side walls 36, the V notches 42 (or any other suitableshape notch for that matter) could be formed in the horizontal surfaceof the housing 32, if desired, with the top of the carrier bar 38 beinglevel with this surface. Another alternative is to raise the height ofthe side walls 36 sufficiently so that the carrier bar 38 can be loweredfor clearance upon its return stroke without the need for entering thegroove 34 in the horizontal surface. Rectangular apertures 55 areprovided in the housing 30 for permitting the piston rods of aircylinders 54 to be moved horizontally during the transport cycle.

Returning to FIG. 2 again, it is seen that a restraining bar 56 isprovided for mounting over the carrier bar 38 which is held in place bysprings 58 and clamping nuts 60. This spring loaded mounting permits therestraining bar 56 to move up with the carrier bar 38 to exert a slightpressure on the reed switches located in the V notches 40 of the raisedcarrier bar 38 to maintain the switches in place during transit.

As already mentioned, the test head 30 has seven stations, with thefirst station to the extreme left in FIG. 2 being a loading station.Each time a reed switch falls through a chute 61 which is located underthe hole in plate 16 (FIG. 1) at point X onto a V track 62 aligned withthe first station, an air cylinder 64 is operated (waveform 4 of FIG. 3)to extend its plunger (not visible) against the lead of the reed switchto push the switch into place in the first station. The switch is slidinto place and stopped by a fixed stop 66 which contacts the other leadof the switch. This movement as well as all those that follow take placewhile the carrier bar 38 is in the normal level position. A light source68 is placed above the track 62 to divert the flow of switches from thecooling table 10, as already mentioned, should a switch become jammedthereby covering the photoelectric cell which lies in the track 62. Thiswould then cause an energizing potential to be applied to theelectromagnet 18 of FIG. 1. The photoelectric control circuitry islocated in the box marked 69.

Once the reed switch is in place in the first station it is moved to thesecond station (immediately to the right of station one) during the nexttransport cycle as previously described (as the switch in the secondstation is moved to the third station and so on). A length test isperformed at the second station to determine if the distance between theends of the switch leads is within a prescribed tolerance. The switch isheld down in place for precise measurement by a spring clip 70 mountedon the underside of the restraining bar 56 as shown in FIG. 2a. As onelead is held against a fixed stop 72, an air cylinder 74 is operated(waveform of FlG. 3) to move the face of its plunger 76 against theother lead. The plunger 76 must travel a minimum distance to operate afirst microswitch 78 and less than some maximum distance to avoidoperating a second microswitch 80. The distances are arranged so thatthe longest tolerable reed in station two stops the plunger 76 after ithas traveled the minimum distance to activate microswitch 78 and'theshortest tolerable reed permits the plunger 76 to travel just slightlyless than the maximum distance to avoid operating microswitch 80. Ifmicroswitch 78 does not operate (switch too long) or microswitch 80 doesoperate (switch too short) a signal L is generated indicating that theswitch failed the length test.

As a length test is performed on a reed switch in station two, aconcentricity test is performed on another reed switch in station threeto test whether or not the two leads of the switch are in exactalignment with one another. Because of the precise measurement required,another spring clip 82 is mounted on the underside of the restrainingbar 56 to hold the reed switch down while in this station. Two aircylinders 84 located opposite one another on either side of the channelare operated (waveform 6) to extend their plungers 86 toward one anotherand the leads of the reed switch. Each plunger 86 has a small cavity inits face which aligns exactly with that of the other and engages a leadof the switch when fully extended to close a microswitch 88. If a leaddoes not align with the cavity of its respective plunger 86, then itimpedes the plunger travel so that the associated microswitch 88 willnot operate. If either one or both microswitches 86 do not operate asignal CN is generated to indicate that the reed switch failed theconcentricity test.

A high voltage breakdown test is performed on each reed switch instation four by applying a high voltage potential across its leadsthrough two pairs of jaws 90 which are closed across the leads by theoperation of air cylinders 92 (waveform 7). The high voltage breakdowntest will be fully explained later.

The fifth station is adjacent a housing 94 which has a test coil (notvisible) into which a reed switch is inserted for testing its variouselectrical operating characteristics. With the reed switch in stationfive an air cylinder 96 is operated (waveform 8) to slide the reedswitch to the right into the test coil so long as the switch passed thefirst three tests (length, concentricity and breakdown). If the switchfails any one of the first three tests an inhibit signal IN is generatedwhich prevents air cylinder 96 from operating by opening the signal pathbetween the microswitch and its solenoid valve. Once inside the coil,air cylinders 98 are operated (waveform 9) to close two pairs ofjaws 100(only one pair visible) on the switch leads. One jaw of each pair 100carries the test current for performing the electrical tests while theother jaw carries the current for measuring the re- Sults, with the jawsbeing insulated from each other to obtain more accurate measurements. Anenable signal (waveform 10) is generated by the timer assembly whichallows the electrical tests to take place and all of the test results tobe processed and displayed as will be fully explained hereinafter.Although this signal does not operate any air cylinder it is suppliedfrom the timer assembly and is included in the mechanical timing chartof FIG. 3 so that the reader can easily relate this period to the othersin the overall test cycle (complete rotation of the cam shaft through360). Following the completion of the electrical tests the reed ispushed out of the test coil back into station five by the operation ofair cylinder 102 (waveform 11).

A switch is deemed good if it meets all of the prescribed standards forall or the tests, in which case an air cylinder 104 adjacent to thesixth station is operated (waveform 12) to push the switch into anunloading chute 106 where it drops by gravity into a hopper below forreceiving the good switches. The unload signal UN corresponding towaveform 12 is the only one in FIG. 3 which is not supplied from thetimer assembly. This signal is supplied from the control panel whichhouses all the electrical circuitry for controlling the electrical andhigh voltage breakdown tests and for processing and displaying the testresults. Since the control panel is fairly large, unlike the test head30 which is compact, it cannot be easily mounted on or immediatelyadjacent to the reed switch manufacturing machine. Therefore it islocated physically apart from the test head 30 and a cable having therequisite number of leads carries the various signals between the testhead 30 and the control panel. The cable plugs into a connector block107 mounted on the side of the test head 30, the connector blockproviding leads for passing control panel signals to and from the testhead 30 as well as the timingjsignals from the timer assembly whichis'also physically isolated from the test head 30. if a switch fails anyone of the tests the signal UN is not generated in the control panel andthe air cylinder 104 therefore is not operated for that switch so thatthe switch is transported to the seventh station where an air cylinder108 is operated (waveform 13) to push the bad switch into an unloadingchute 110 where it drops into a different hopper below for receiving thebad switches.

The electrical test apparatus for performing the electrical and highvoltage breakdown tests and for measuring the results thereof comprisesany suitable solid state I circuitry, preferably located in a box 112mounted on the test head 30 itself to minimize noise and attenuation ofthe analogue test and measurement signals. The test apparatus which isshown schematically in FlG. 6 by general reference numeral 113 iscontrolled by digi tal signals generated in a test control logic circuitlocated in the aforementioned control panel. The high voltage breakdowntest circuitry comprises a high voltage source 114 which generates ahigh voltage potential at its output in response to a signal HV(G)applied to its input from the test control logic circuit. This potentialis applied across the leads of areed switch while located in stationfour via the jaws 90 and a capacitor 116. A radioactive ionizing source118 is located in the carrier bar 38 at station four to ionize the airgap of the reed switch from below to enable it to pass current underbreakdown even though the switch is open. Because a relay 120 or otherequivalent device is operated by the signal HV(G) at this time, itsnormally closed contacts 122 shunting the capacitor 116 are open so thatcapacitor 116 is free to charge up as current passes through it via theswitch if breakdown should occur. A voltage comparator 124 is connectedacross the capacitor 116 to compare the developed voltage over apredetermined period with some minimum voltage which would indicate theflow of current and the occurrence of breakdown. When the minimumvoltage is exceeded the voltage comparator 124 generates a signal VB(voltage breakdown) which is applied'to a results control logic circuitin the control panel indicating that the reed switch failed the voltagebreakdown test. Upon completion of this test the signal HV(G) isremoved, thereby de-energizing the'relay 120 which permits the contacts122 to close and the capacitor 116 to discharge therethrough. Power foroperating the high voltage and current sources is applied through aconnector 123 on the test head 30 as shown in FIG. 2.

Five electrical tests are performed on a reed switch while in the testcoil adjacent station five, these being:

1. Contact resistance to ensure that the resistance of the switch whenclosed does not exceed some maximum allowable value.

2. Low gap to ensure that the air gap is not so small that the switchoperates (closes) before it is supposed to, e.g., at some predeterminedvalue of magnetic flux produced by the test coil.

3. High gap to ensure that the air gap is not so large that the switchcannot operate when it is supposed to, e.g.. at a second predeterminedvalue of magnetic flux produced by the test coil which is higher thanthe first value.

4 Hold to ensure that the switch remains operated when it is supposedto. e.g., at a predetermined value of magnetic flux greater than thefirst value but. less than the second value.

5. Release to ensure that the switch releases when it is supposed to,e.g., at a fourth predetermined value of magnetic fiux less than thefirst value.

The different currents necessary to provide the different values ofmagnetic flux in the test coil are provided by a magnetizing currentsource 126 whose current output I is a function of the magnitude of asignal MC (magnetizing current) appliedto its input from the testcontrol logic.

The test results are determined by applying a fixed current I to theleads of the switch from a test current source 128 in response to asignal TC (test current) from the test control logic. Since the currentI is fixed, the voltage across the switch is directly proportional toits resistance when closed. A voltage comparator 130 whose input isconnected across the switch compares the voltage across the switch witha first reference voltage Which corresponds to the maximum resistanceacceptable. If the measured voltage exceeds this reference voltage thecomparator 130 generates a signal CR (contact resistance) indicating theswitch resistance is excessive. The switch is considered to be open whenthe switch is in fact open or the switch resistance greatly exceeds themaximum acceptable resistance. The voltage comparator 130 provides asecond reference voltage equal to the fixed current I multiplied by thegreater value of resistance. Any time the measured voltage across theswitch exceeds'the second reference .voltage, the comparator generates asignal CO (contacts open) rather than the signal CR.

Before going into the details of the logic circuitry in the controlpanel which controls the electrical test apparatus and the processingand displaying of test results it may be advantageous to consider theblock diagram of FIG. 7 which shows the basic components of i thecontrol panel and traces the various signal paths. The test controllogic 132 initiates all activity in the control panel in response to theenable signal (waveform 10 of FIG. 2) from the timer assembly. Itgenerates the aforementioned three signals TC, MC and HV(G) which areapplied to the electrical test apparatus 113 for controlling itsoperation. The results control logic 134 serves the very importantfunction of monitoring the test results including relating the resultsof the switch tested to separate the good switches fromthe bad. Thus thefailure signals VB, CR and CO from the electrical test apparatus! 13 arefed into the resultscontrol logic 134, as well as the failure signals Land CN from the test head 30. To properlyrelate the test results to eachof the switches, thetimer assembly applies the enable and index signalsto the results control logic 134 while the test control logic 132applies various electrical test period (A-G) signals over individualleads. The test results are strobed by a signal TS from the test controllogic 132 to minimize errors introduced by noise and spurious signals.The results control logic 134 applies the feedback control signals INand UN to the test head 30 to respectively inhibit a reed switch frombeing inserted into the test. coil if necessary and to unload the goodswitches at station six as explained earlier.

To immediately provide the operator with important feedback informationfor quality control the control panel displays the results of four testsof those reed switch characteristics which are controllable and may bealtered by the operator by making appropriate adjustments on themanufacturing heads. These tests are for length, concentricity, low gapand high gap so that in the control panel. The display unit 136 providesa visual display of these failures for each switch in accordance withthe manufacturing head on which the switch was produced so that theoperator is directed to the appropriate head requiring adjustment. Torelate the failures to the proper manufacturing head the display unit136 receives a shift signal Sl-l from the results control logic 134 anda display signal (DIS-G) from the test control logic 132.

As already mentioned the electrical and high voltage breakdown tests andall the test results (including those for length and concentricity) areprocessed and displayed during the enable period (waveform of FIG. 3.The test control logic 132 which is shown in detail in FIG. 8 providesthe signals MC and TC for controlling respectively the magnetizing andtest currents applied by the electrical test apparatus for theelectrical operating characteristics and in addition breaks the enableperiod into seven discrete periods A-G, five of which are used for thefive electrical tests, and one for the high voltage breakdown test asshown by the signal waveforms in FlG. 9, the upper level of thewaveforms representing the activating signal. Looking at FIG. 9, it isseen that the first period A within the enable period is devoted to thecontact resistance test. During this period the magnetizing current tothe test coil is increased by the control signal MC from a value of zeroto a high enough value MCI to operate the reed switch inserted thereinafter which the current I is reduced to a constant level MC2 sufficientto hold the switch operated. With the switch operated at the constantlevel of current MC2, the test current I is applied to the switch leadsto compare its contact resistance-with that of the acceptable maximum.The period B is provided to first magnetically saturate the switch witha magnetizing current MC3 before reducing the magnetizing current tozero preparatory to performing the electrical operating tests. Duringperiod C the current is increased from zero to a constant value MC4which is not great enough to operate a reed switch having a gap equal toor greater than the minimum acceptable. Toward the end of the period thetest current 1 is applied to the switch leads to determine whether ornot the switch is operated, the generation of the signal CO by thevoltage comparator 130 (FIG. 6) indicating that the switch did notoperate. Operation of the switch during period C of course means thatthe switch failed the low gap test.

During period D the magnetizing current l is increased to a higherconstant value MCS which is sufficient to operate a reed switch having agap equal to or less than the maximum gap acceptable. Toward the end ofthe period the current I is again applied to the switch leads. Operationof the switch' during period D means that the switch passed the high gaptest. During period E the magnetizing current I is increased to a peakvalue, MC6 to ensure the operation of the switch, then reduced to aconstant value MC7 in between MC4 and MCS' to test the holdingcharacteristic of the switch. At this constant value of magnetizingcurrent MC7 the switch should remain operated. During period F themagnetizing current is reduced to a constant value MC8 which is lessthan MC4 and is not sufficient to maintain a normal switch operated andtherefore, the switch should release.

the respective failure signals L, CN, LG and HG are fed 7 from theresults control logic l34'to a display unit 136 Following the completionof the electrical operating l tests the high voltage breakdown'testisperformed during period G. Since this test is performed at a differentstation than the foregoing tests it could be done simultaneously withthose tests, butit is not to avoid introducing spurious signals, causedby the high voltage during the breakdown test, into the sensitiveelectrical operating test measurements which might otherwise produceinaccurate results. To further minimize the possible adverse effect ofspurious signals and noise the test results are registered in theresults control logic 134 only during the brief time slot at the end ofeach test period provided by the test strobe signal TS generated in thetest control logic 132. To minimize the complexity of the circuitry inthe test control logic 132 the periods A-G are formed with threedifferent time periods, one for periods A and G, one for B and one forperiods CF.

The test control logic 132 of FIG. 8 comprises a binary counter 138which counts down from any one of three different counts, eachcountcorresponding to a different one of the three time periods just referredto. The output of the counter 138 is connected to a first decoder 140which produces negative pulses on its output leads indicative of thecount in said binary counter. The zero output of decoder 140 is fed backto the binary counter 138 to provide a load signal which enables thecount to be entered and to a shift register 142 to provide a shiftsignal for shifting the positive output signal of the register 142 fromlead to lead. The output leads of shift register 142 provides the sevenperiods A-G'as well as the information for entering the counts in binarycounter 138. Whenever the output signal of register 142 is applied toleads A or G in the presence of the load signal, an OR gate 144 enters acount in binary counter 138 corresponding to the time period for periodsA and G meaning that the time it takes for the counter 138 to count downto zero is equivalent to said time period. Whenever the output signal ofregister 142 is applied to lead B in the presence of the load signal itis also applied to the binary counter 138 to load a corresponding counttherein. The binary counter 138 is programmed so that if no signal isapplied thereto in the presence of a load signal it automaticallyselects a count equivalent to the third time period for periods C-F.

When the enable signal is applied by the timer to the shift register 142and binary counter 138 (the decoder 140 output is on zero at thistime),the shift register output is applied to its A lead loading acorresponding count in the counter 138 which then begins counting downto zero in response to the clock pulses. When zero is reached thenegative pulse on the zero output of decoder 140 causes the output ofregister 142 to shift to its B lead while a corresponding count isloaded into the counter 138. Once again the counter 138 counts down tozero after which the output of register 142 shifts to its C lead loadinga corresponding count in the counter 138. The process is repeated untilall seven periods A-G have been generated at which time the enablesignal is removed inhibiting the shift register 142 andbinary counter138.

The test strobe signal TS is obtained from the Q output of a flip-flop145 whose reset input R is connected to the zero output of decoder 140and whose set input S is connected to another output 146 of decoder 140corresponding to any suitable count for providing the desired strobeperiod. Toward the end of each of the strobe period for performing themeasurements to obtain the results for the electrical operatingcharacteristics. A flip-flop 148 has its reset output R connected to thezero output of decoder I40 while its set input S is connected'to anoutput 150 which corresponds to a slightly higher count than output 146so that the test current I is already present when the test strobesignal TS is generated. The signal TC is obtained from the Q output offlip-flop 148 through an OR gate 152 for the periods C-F. During periodB when no test current is required the signal is inhibited by connectingthe output of OR gate 152 to the B output of shift register 142 throughan inverter 154. The longer period of test current l required duringperiod A for the contact resistance test is provided by enabling OR gate152 from a second input which will be explained shortly.

The signal MC for controlling the magnitude of magnetizing current I isprovided through a digitallanalogue converter 154 whose output at anytime is of course a function of the magnitude of the input digitalsignal and whose rate of change is a function of the speed of thecounter driving it, the change being in the same direction in which thecounter is counting (up or down). This affords a simple and convenientcontrol for providing the various ramp and constant current levels whichconstitute the magnetizing current I The input to the D/A converter 154is derived from an up/- down binary counter 156 whose output is'alsoconnected to a decoder 158 which has a number of output leads each ofwhich corresponds to a different count in the counter 156 forgenerating'positive pulses to provide the different current levels forthe magnetizing current I When the enable signal from the timer isapplied to the counter 156 it immediately/starts counting up from zeroin response to the clock pulses applied thereto. The count may bestopped at any point in response 'to a stop signal from an OR gate 160having five input leads for enabling the gate, each during a differentone of the seven periods A-G, with the exception] of periods B and G.The count may also be reversed from up to down by a count-down signalgenerated by the output of a flip-flop 162 when set in response to theoutput of a NOR gate 164 having two inputs. At the end of each enableperiod the flip-flop 162 is automatically reset via .aNOR gate 166having one of its inputs connected to receive the enable signal throughan inverter 168. Thus at the beginning of the next enable period flipflop 162 is reset and the count down signal is not generated so that thebinary counter 156 begins its operation by counting up.

During period A when the counter 156 reaches a count corresponding toMCI, the MCI output of decoder 158 together with the A output ofregister 142 enables an AND gate 170 to generate a signal which isapplied to one of the inputs of NOR gate 164 to enable it to pass asignal for setting flip-flop 162. The binary counter nowbeginsimmediately counting down until it reaches a count correspondingto MCZ, at which time the MCZ output of decoder 158 together with the Aoutput of register 142 and the high output of flip-flop 162 (now in theset state) fully enables an AND gate 172 to generate a signal whichcauses OR gate 160 to generate the stop signal. The counter 156 is thusstopped at the.MC2 count and remains at this count for the duration ofperiod A. The output of AND gate 172 is also fed back to thesecond inputof OR gate 152, as previously alluded to, for providing the TC signaland thus the test current I also for the duration of period A. a

At the termination of period A, the shift register 142 output appears onlead B thereby partially disabling AND gate 172 removing the stop signalapplied to the counter 156. The B output of register 142 is appliedcontinuously as a load signal via. one input of an OR gate 173 tocounter 156 which is programmed in the absence of any other loadinginputs to jump to a count corresponding to MC3. A flip-flop 174 isprovided for changing the magnetizing current I to zero at theappropriate time during period B. The Q output of flip flop 174 whenset, together with the B output of "register 142 fully enables an ANDgate 176 to enter a count of zero in counter 156. The flip-flop 174 hasits set inputS connected to an output 175 of the decoder correspondingto the time at which I is to go from MC3 to zero, with its reset input.R connected to the zero output of decoder 140. t

The B output of register 142 is also connected to the second input ofNOR gate 166 to reset flip-flop 162 at the beginning of the B period.Consequently, when period C begins the counter 156 beings counting upfrom zero (the load signal provided by B is also removed at this time).At a count corresponding to MC4, the MC4 output of decoder 158, togetherwith the C output of register 142 enables an AND gate 178 to once againcause OR gate to generate the stop signal freezing the count of counter.156 at that level for the duration of period C. During period Dthecounter 156 continues to increase its count until that corresponding toMCS whereupon the MCS output of decoder 158 together with the D outputof register 142 enables an AND gate .180 to once again stop the countfor the durationof period D.

In period E the counter begins counting again until a countcorresponding to that of MC6 whereupon the MC6 output of decoder 158which is connected to the second input of NOR gate 164 enables gate 164to set flip-flop 162, changing the count to the down direction. At acount corresponding to MC7, and AND gate 182 isfully enabled (by outputsE and MC7) to stop the count for the duration of period E.

During period F the count progresses downward until that correspondingto MC8 where it remains for the duration of the period as a result ofenabling an AND gate 184. During period G the count of counter 156 ismaintained at zero by generating the load signal once again from theoutput of OR gate 173 through a second input connectedto the G output ofregister 142 (recalling The results control logic 134 of F l0. 10includes five flip-flops, each one being provided for storing theinformation for the results of adifferent one of the five electricaltests of the reed switch. Any time that a flip-flop is set it indicatesthat the particular reed switch failed the electrical test associatedtherewith. For instance, a flip-flop 186, which monitors contactresistance has its Q output connected to a counter 188 to count eachtime flip-flop 186 is set, or in other words the number of reed switchesfailing the contact resistance test. This information is not displayedfor the immediate feed back benefit of the operator since he has nocontrol over the manufacturing machine with regard to thischaracteristic. Flip-flops 190 and 192, which monitor the low gap andhigh gap tests respectively have their Q outputs connected to thedisplay unit 136 for immediate feedback control purposes. Like thecontact resistance characteristic, the hold and release characteristicsare not'under the control of the operator so that the outputs offlip-flops 194 and 196, which monitor these two tests respectively, arenot connected to the display unit 136. The Q outputs of all fiveflip-flops 186-196 are connected to an AND gate 198 whose outputprovides 'a signal anytime that a reed switch fails at least one of theelectrical tests. The reset inputs R of these flip-flops are allconnected to receive the enable signal so that those flip-flops setduring the enable period are reset at the end of the period preparatoryto the testing of the next switch.

The output A of register 142 'is connected to a NAND gate 200 topartially enable said gate during period A to set flip-flop .186. Thegate 200 is fully enabled by a signal on its second input which isderived from an AND gate 202 during the application of the test strobesignal TS to one of its inputs while the signal CR is applied to itsother input. The CR signal is, of course, generated by the voltagecomparator 130 in the electrical test apparatus 113 only if the reedswitch failed the control resistance test.

The flip-flops 190-196 are all controlled during their respectiveperiods C-F by the signal CO which indicates that the reed switch undertest is operated (closed). Flip-flops 190 and 196 are set to indicatefailure of the respective tests, low gap and release, if the signal COis present (switch closed) while flip-flops 192 and 194 are set toindicate failure of their respective tests, high gap and hold if thesignal CO is not present (switch open). An AND gate 204 is fully enabledby the signals TS and CO applied to its inputs. The output of AND gate204 is connected to the S inputs of flip-flops I90 and 196 via NANDgates 206 and 208 respectively. Consequently when AND gate 204 is fullyenabled during period C, (low gap test) the output C of register 142applied to the second input of gate 206 fully enables said gate to setflip-flop 190. Similarly fully enabling AND gate 204 during period P(release test) sets flipflop 196.

The output of AND gate 204 is passed through an inverter 210 and thenapplied to'the S inputs of flip-flops 192 and 194 via NAND gates 212 and214 respectively.

Consequently when AND gate 204 is disabled during period D, Nand gate212 is fully enabled by the output of gate 204 and the D output ofregister 142 to set flipflop 192. Similarly NAND gate 214 is fullyenabled during period E to set flip-flop 194 when AND gate 204 isdisabled.

Because the operator also has no control over the high voltage breakdowncharacteristic, the results of this test are not displayed but merelymonitored by a counter 216 which counts the number of failures v-ia Qoutput of a flip-flop 218 which stores the information. F lip-flop 218is set in response to the signal VB indicating a failure which isapplied to an input of a NAND gate 220 that is fully enabled during theG period in the presence of the test strobe via an AND gate 222.Flipflop 218 is reset each time at the end of the enable period.

The signals L and CN from the test head indicating length andconcentricity failures are applied to two NAND gates 223 and 224respectively which are partially enabled during period A in the presenceof the test strobe via an AND gate 226. Their outputs are connected tothe S inputs of two flip-flops 228 and 230 respectively for settingthese when fully enabled. The Q outputs of flip-flops 228 and 230 areconnected to the display unit 136 for displaying the results of thelength and concentricity tests to provide immediate feedback informationto the operator.

A shift register 232, comprising five flip-flops, is used to determineif a switch is good or bad by simultaneously receiving the test resultsfor the switches in test stations two through five of the test head 30and shifting the information from flip-flop to flip-flop in synchronismwith the movement of the switches. For instance, the first flip-flop 234has its CD (clear direct) input connected to the output of NAND gate 223so that a negative pulse indicating a length failure for the switch instation two resets flip-flop 234 causing a low signal to appear at its 0output. Similarly a flip-flop 236, which has its CD input connected tothe output of NAND gate 224, is reset by a negative pulse indicating aconcentricity failure for the switch in station th ee. A flip-flop 238has its CD input connected to the 0 output of flip-flop 218 to receive areset signal therefrom for failure of the high voltage breakdown test bya switch in station four. A flip-flop 240 has its CD input connected tothe output of AND gate 198 to receive a reset signal therefrom forfailure of any one or more of the electrical tests by a switch while inthe test coil adjacent station five. A flip-flop 242 provides a signalat its 0 output indicating whether the switch in station six is good orbad, a high signal indicating good and a low signal indicating bad.

Each flip-flop of register 232 has its Q output lead connected to the Dinput lead of the next flip-flop (to the right) so that when toggled bya negative going pulse on its T input its 0 output is transferred to thefollowing D input. The toggle signal is supplied from the Q output of aflip-flop 244 which is reset each time the machine indexes by applyingto its. reset input R through an inverter 246, the raise carrier signal(waveform 1 of FIG. 3) and is set at the beginning of the enable periodby applying the enable signal to its set input through an inverter 248.Thus as a switch moves from one station to the next the information forit is passed from one flip-flop to the next. As soon as a switch fails atest the flip-flop of register 232 associated with that test is resetand the low signal of the Q output is thereafter shifted from flip-flopto flip-flop as the switch moves from station to station until itarrives at station six. If the switch passed all of the tests then thehigh Q output or flip-flop 242, indicating a good switch. together withthe enable signal fully enables an AND gate 250 to generate the unloadsignal Un applied to air cylinder 104 to enable it to push the switch inthe good switch hopper. A low Q output of flip-flop 242, indicating abad switch, disables AND gate 250 inhibiting the signal UN so that aircylinder 104 is not operated, thereby permitting the switch to betransported to station seven where it is unloaded in the bad switchhopper. A counter 252 is connected to the output of AND gate 250 ofmonitor the number of good switches tested by registering the number ofhigh signal pulses received. v

A flip-flop 254 has its D input connected to the Q output of flip-flop238 to provide the inhibit signal IN which is applied to the test head30 to inhibit air cylinder 96 from pushing a switch located in stationfive into the test coil if it failed any one of, the first three tests(length, concentricity or high voltage breakdown). As such a switch ismoved from station four to station five the low Q output of flip-flop238 is transferred to the .0 output of flip-flop 254 upon toggling sothat the signal IN will be present when the switch arrives in stationfive. Although air cylinder 96 is actually controlled from the timerassembly for timing purposes the path for the signal may be easilyopened in one of many different ways, such as by a relay which isresponsive to the signal IN. x

The display unit 136 in the control panel for displaying the reed switchtestresults comprises a matrix array of lamps 256, each having its ownassociated logic circuitry 258 for energizing the light as shown in FIG.11. Each column consists of four lamps for each one of the N pluralityof machine manufacturing heads"(the machine head being identified bynumbers at the top of each column) while each row corresponds to one ofthe four tests selected for display, namely length (L), concentricity(CN), low gap (LG) and high gap (HG). Each lamp is operated when aswitch manufactured on the head corresponding to its column fails thetest cor.- responding to its row. Each of the four failure signal leadsfrom the results control logic is connected to all of the logic circuits258 associated with that particular row of lamps. The display unit 136vfurther comprises a ring counter 260 having N output leads with eachlead being connected to four logic circuits 258, one in each row in sucha manner so as to control the lighting of the proper lamp for the properswitch and test. Bearing in mind that the results of the length testfora switch in station two, the concentricity test for a switch instation three and the low-gap and high gap tests for a switch adjacentstation four are received simultaneously and the reed switches arereceived in the test head from the machine head in increasing numericalsequence, it may be appreciated that the proper lamps will always belighted be connecting each output lead of counter 260. to a logiccircuit 258 in a given column in the first row (L), the logic circuit258 in the first column preceding said given column in the second row(C) and the logic circuits 258 in the third column preceding said givencolumn in the third (LC) and fourth (HG) rows. The control signal ofcounter 260 is shifted from one-output lead to the'next by a shiftsignal SH received from the output of flip-flop 244 in the resultscontrol logic 134 when set at the beginning of each enable period.

Each logic circuit 258 is seen to contain two flip-flops 262 and264, aNAND gate 266 for providing a toggle signal, an AND gate 268 for passingthe test information and an AND gate 270 for energizing the lamp 256when fully enabled by both its inputs to indicate a test failure. Forthe moment assume that flip-flop 264 is maintained in a set state by theapplication of a display each failure signal to its DS input so that itsQ output is high and AND gate 270 is partially enabled and thatfurthermore flip-flop 262 is in a :reset state. The AND gate 270 is thenfully enabled when flip-flop 262 is set (Q output high) which will occurupon toggling if AND gate 268 is fully enabled when the control signalfrom counter 260 is applied to its input in the presence of a failuresignal on its other input, the failure signal corresponding to the rowfor that particular logic circuit. The toggle signal is supplied eachtime during period G by the output of register 142 in the test controllogic '132'in the presence of the control signal from counter 260. Oncelit the lamp 256 remains lit until AND gate 270 is disabled which willoccur only when flip-flop 262 is resetduring some subsequent toggleperiod by a low output from AND gate 268, which is disabled by theabsence of a failure signal for some later tested switch. in other wordsonce a lamp 256 for a particular machine head operates to indicate aparticular test failure it remains operated until some following switchproduced on that-same machine head passes that particular test. Bylooking at the lamps for each machine head, the operator knows at aglance which of the four controlled characteristics for each machinehead needs adjustment.

To aid the operator in deciding whether or not to make adjustments itmay be desirable to convey such a need byoperating a lamp 256 only iftwo successive switches from the corresponding manufacturing head failthe same test rather than each time a switch'fails that test. It willbe'readily seen that such will be the case when the display each failuresignal is removed from flip-flop 264 by the operator pushing a button onthe display panel. The test failure of the first switch sets flip-flop262 while the test failure of the next switch sets flip-flop 264 tofully enable AND gate 270.

It may now be readily appreciated that the unique transport assemblyused for transporting the reed switches from station to station togetherwith the mechanical test movements employed in the reed switch analyzerresult in a test head which is compact and so designed that it may beadded to or removed from the manufacturing machine quite easily andconveniently without interfering with production output. This is sobecause no direct mechanical linkage interconnect the test head with themanufacturing machine so that the latter need not be stopped to permitadding or removing the former. Synchronism between the two is providedby the timerf'assembly which is mechanically linked to the manufacturingmachine but is electrically linked to the test head so that to disengagethe test head it is only necessary to remove the connector cable withoutstopping the machine. The connector cable also carries the control anddisplay digital signals to and from the control panel so that theequipment therein need not encumber the manufacturing machine. Thus thereed switch analyzer of this invention is able to sep arate goodswitches from the bad as they are received from the manufacturingmachine without any human intervention while at the sametime providingimmediate feedback information to the machine operator for qualitycontrol purposes. The specific embodiment de scribed herein is intendedto be merely illustrative and not restrictive of the invention sincevarious modifications thereto may be readily apparent to those familiarwith the art without departing from the scope and spirit of theinvention as set forth in the claims hereinbelow.

What is claimed is:

1. A transport assembly for moving reed switches or the like fromstation to station comprising:

a housing having an open channel formed in a horizontal surface thereofwith support notches located opposite one another on either side of thechannel spaced along the channel, each pair of oppositely placed notchesdefining a station in which a reed switch is to be received;

a carrier bar positioned within the channel which is free to movevertically or horizontally relative thereto, said carrier bar havingnotches along its length which align with said pairs of support notcheswhile said bar is in a level position relative to the channel surfaceand in a normal position relative to the channel length;

a transport member for moving said bar, including raise means which isactivated to raise said bar from the level position so that theundersides of any reed switches received in the notches thereof-clearthe top of said support notches, lower means which is activated to lowersaid bar below the level position so that the top surface of the barclears the undersides of the reed switches received in said supportnotches and sliding means which is activated to advance said barhorizontally so that each of said bar notches are advanced to the nextpair of support notches and is deactivated to return said bar to thenormal position, and

timing means for controlling said transport assembly in the followingcyclical sequence: l) activate said raise means, 2) activate saidsliding means, 3) deactivate said raise means and activate said lowermeans, 4) deactivate said sliding means and 5) deactivate said lowermeans.

2. The transport assembly of claim 1 wherein each of the transportassembly means includes a pneumatic device which is responsive toelectrical signals from said timing means.

3. The transport assembly of claim 2 wherein the generation ofelectrical signals by said timing means is mechanically controlled by acam shaft adapted to be synchronized to and driven by a machine used forproducing the reed switches.

4. The transport assembly of claim 2 wherein said pneumatic devices areair cylinders controlled by solenoid valves.

5. The transport assembly of claim 4 wherein said sliding means includesa slider connected to the piston rod of an air cylinder and a horizontalguide for restricting the slide to horizontal movement.

6. The transport assembly of claim 5 wherein said transport memberincludes a horizontal plate situated below said slider and the aircylinder of said lower means is affixed to said slider while its pistonrod is affixed to said plate for lowering said plate when activated andsaid raise means comprises two air cylinders affixed to said plate whiletheir piston rods are affixed to said carrier bar for raising same whenactivated.

1. A transport assembly for moving reed switches or the like fromstation to station comprising: a housing having an open channel formedin a horizontal surface thereof with support notches located oppositeone another on either side of the channel spaced along the channel, eachpair of oppositely placed notches defining a station in which a reedswitch is to be received; a carrier bar positioned within the channelwhich is free to move vertically or horizontally relative thereto, saidcarrier bar having notches along its length which align with said pairsof support notches while said bar is in a level position relative to thechannel surface and in a normal position relative to the channel length;a transport member for moving said bar, including raise means which isactivated to raise said bar from the level position so that theundersides of any reed switches received in the notches thereof clearthe top of said support notches, lower means which is activated to lowersaid bar below the level position so that the top surface of the barclears the undersides of the reed switches received in said supportnotches and sliding means which is activated to advance said barhorizontally so that each of said bar notches are advanced to the nextpair of support notches and is deactivated to return said bar to thenormal position, and timing means for controlling said transportassembly in the following cyclical sequence: 1) activate said raisemeans, 2) activate said sliding means, 3) deactivate said raise meansand activate said lower means, 4) deactivate said sliding means and 5)deactivate said lower means.
 2. The transport assembly of claim 1wherein each of the transport assembly means includes a pneumatic devicewhich is responsive to electrical signals from said timing means.
 3. Thetransport assembly of claim 2 wherein the generation of electricalsignals by said timing means is mechanically controlled by a cam shaftadapted to be synchronized to and driven by a machine used for producingthe reed switches.
 4. The transport assembly of claim 2 wherein saidpneumatic devices are air cylinders controlled by solenoid valves. 5.The transport assembly of claim 4 wherein said sliding means includes aslider connected to the piston rod of an air cylinder and a horizontalguide for restricting the slide to horizontal movement.
 6. The transportassembly of claim 5 wherein said transport member includes a horizontalplatE situated below said slider and the air cylinder of said lowermeans is affixed to said slider while its piston rod is affixed to saidplate for lowering said plate when activated and said raise meanscomprises two air cylinders affixed to said plate while their pistonrods are affixed to said carrier bar for raising same when activated.